First Evaluations of the Neighbor Logic of the digital SiPM tile

Schug, David; D├╝ppenbecker, Peter Michael; Gebhardt, Pierre; Weissler, Bjoern; Zwaans, Ben; Kie├čling, Fabian; Schulz, Volkmar

Piscataway, NJ : IEEE Operations Center (2012)
Contribution to a book, Contribution to a conference proceedings

In: 2012 IEEE Nuclear Science Symposium and Medical Imaging Conference record, (NSS/MIC 2012) : Anaheim, California, USA, 27 October - 3 November 2012 ; [and the 19th Room-Temperature Semiconductor X-Ray and Gamma-Ray Detector Workshop] / [sponsored by: the Nuclear and Plasma Sciences Society of the Institute of Electrical and Electronic Engineers. Guest ed.: Bo Yu]
Page(s)/Article-Nr.: 2817-2819