Initial Measurements with the PETsys TOFPET2 ASIC Evaluation Kit and a Characterization of the ASIC TDC

Schug, David (Corresponding author); Nadig, Vanessa; Weissler, Bjoern; Gebhardt, Pierre; Schulz, Volkmar

New York, NY : IEEE (2018, 2019)
Fachzeitschriftenartikel

In: IEEE transactions on radiation and plasma medical sciences
Band: 3
Heft: 4
Seite(n)/Artikel-Nr.: 444-453

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