Initial Measurements with the PETsys TOFPET2 ASIC Evaluation Kit and a Characterization of the ASIC TDC

Schug, David (Corresponding author); Nadig, Vanessa; Weissler, Bjoern; Gebhardt, Pierre; Schulz, Volkmar

New York, NY : IEEE (2018, 2019)
Journal Article

In: IEEE transactions on radiation and plasma medical sciences
Volume: 3
Issue: 4
Page(s)/Article-Nr.: 444-453